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Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system. Computer implemented circuit synthesis system. Existing ATPG tools may be used without modification by performing scan insertion on a “dummy” circuit and performing ATPG on the scan-augmented dummy circuit.

The test vector bits are passed between adjacent lairent of the shift register arrangement timed with the first clock signal 42 and an output response of the integrated circuit to the test vector is provided and analyzed. The result is that the flip-flop clock is forced high preventing any transition of the flip-flop internal clock tree for all stages or cells where the output is low.

In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell 34 which comprises a flipflop 11 and means 31 able to set the output voltage of the cell when the circuit is in the operation mode. In the scan test mode, the counter operates as a shift register and it is fully testable.

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The resulting ATPG vectors are then modified to perform pseudo scan of selected components of the original circuit. The output response of the integrated circuit to the test vector is provided under the control of a second clock signal 56 which is slower than the first clock signal.

Laurent Souef

The memory is configured to provide a database, and is operative to store a netlist including nets of an integrated circuit under design. Laurent Souef, Emmanuel Alie. Low power soueff counter. Frederic Natali, Laurent Souef. Lauretn integrated circuit is disclosed comprising a plurality of circuit portionseach of the circuit portions having an internal supply rail coupled to a global supply rail via a cluster of switches ; coupled in parallel between the internal supply rail and the global supply rail A key handling circuit for a switching matrix having row and column conductors includes bidirectional drives for the row conductors and the column conductors.

The automatic test pattern generation ATPG algorithm is operative to design and test an integrated circuit design. Method of testing an integrated circuit by simulation. Koninklijke Philips Electronics N.

The test arrangement comprises a test control input; a test output coupled to the respective internal supply rails and control means, coupled to the test control input for enabling a selected cluster of switches ; in the test mode.

A computer implemented circuit synthesis system includes a memory, an automatic soueg pattern generation ATPG algorithm, and processing circuitry. This testing method speeds up the process by increasing the speed of shifting test vectors and results into and out of the shift register, but without comprising the stability of the testing process.

Each of the stages or cells comprises a flip-flop and a multiplexer which together operate as a toggle flip-flop only when all of the previous flip-flops are set.


The present invention, generally speaking, provides an integrated wouef testing technique in which hardware accessibility of selected components is exploited in order to avoid scan insertion overhead but achieve as good or better fault coverage than if scan insertion had been used.

dblp: Laurent Souef

Furthermore, the method can be implemented without requiring additional complexity of the testing circuitry to be integrated onto the circuit substrate.

Patrick Da Silva, Laurent Souef. The row drive and the column drive are in a low conductive condition except when a relevant key switch is activated.

Each cluster of switches ; has a first switch having a first size and a second switch having a second size, a fault-free first switch having a higher resistance than a fault-free second switch Thus, no power consumption of such stages takes place during functional operation.

Cell with fixed output voltage for integrated circuit. The IC further comprises a test arrangement for testing the respective clusters of switches ; in a test mode.

Laurent Souef – Semantic Scholar

Laurent Souef, Didier Gayraud. Clock-skew resistant chain of sequential cells.

These means for setting the output voltage are controlled by a control signal 15 which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode. Design for test area optimization algorithm. Jerome Bombal, Laurent Souef.